Spectroscopic Ellipsometry and Reflectometry A User’s Guide 1st edition by Harland Tompkins, William McGahan – Ebook PDF Instant Download/Delivery: 0471181722, 978-0471181729
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Product details:
ISBN 10: 0471181722
ISBN 13: 978-0471181729
Author: Harland Tompkins, William McGahan
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
Spectroscopic Ellipsometry and Reflectometry A User’s Guide 1st Table of contents:
Chapter1 : Introduction
Chapter 2: Content
Chapter 3: Conclusion
Chapter 4: Appendices
Chapter 5: Glossary
Chapter 6: References
Chapter 7: Index
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Tags: Harland Tompkins, William McGahan, Spectroscopic Ellipsometry, User’s Guide